High coercivity and magnetic domain observation in epitaxially grown particulate FePt thin films

Journal of Magnetism and Magnetic Materials

Volumn 266, Issue 1-2, 2003, Pages 171-177

  Shima, T ^a   Takanashi, K ^a   Takahashi, Y K ^b,d   Hono, K ^b   Li, G Q ^c   Ishio, S ^c  

^a TOHOKU UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c AKITA UNIVERSITY   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

FePt; Magnetic domain structure; Microstructure; Sputtering; Thin film

Indexed keywords

COERCIVE FORCE; EPITAXIAL GROWTH; IRON COMPOUNDS; MAGNETIC DOMAINS; MICROSTRUCTURE; SPUTTERING;

MAGNETIC FORCE MICROSCOPY (MFM);

MAGNETIC THIN FILMS;

EID: 0141732231     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(03)00468-2     Document Type: Conference Paper

References (17)

1. Kittel C. Phys. Rev. 70:1946;965.
2. Stoner E.C., Wohlfarth E.P. Phil. Trans. Roy. Soc. A. 240:1948;599.
3. Jacobs J.S., bean C.P. Phys. Rev. 100:1955;1060.
4. Ovanov O.A., Solina L.V., Demshina V.A. Phys. Met. Metallogr. 35:1973;81.
5. Yung S.W., Chang Y.H., Lin T.J., Hung M.P. J. Magn. Magn. Mater. 116:1992;411.
6. Lairson B.M., Viosokay M.R., Sinclair R., Clemens B.M. Appl. Phys. Lett. 62:1993;639.
7. Lairson B.M., Clemens B.M. Appl. Phys. Lett. 63:1993;1438.
8. Cebollada A., Weller D., Sticht J., Harp G.R., Farrow R.F.C., Marks R.F., Savoy R., Scott J.C. Phys. Rev. B. 50:1994;3419.
9. Visokay M.R., Sinclair R. Appl. Phys. Lett. 66:1995;1692.
10. Watanabe M., Homma M. Jpn. J. Appl. Phys. 35:1996;L1264.
11. Ide Y., Goto T., Kikuchi K., Watanabe K., Onagawa J., Yoshida H., Cadogan J.M. J. Magn. Magn. Mater. 177-181:1992;411.
12. Shima T., Takanashi K., Takahashi Y.K., Hono K. Appl. Phys. Lett. 81:2002;1050.
13. Y.K. Takahashi, K. Hono, T. Shima, K. Takanashi, to be published.
14. Shima T., Moriguchi T., Mitani S., Takanashi K. Appl. Phys. Lett. 80:2002;288.
15. Thiele J.-U., Folks L., Toney M.F., Weller D.K. J. Appl. Phys. 84:1998;5686.
16. Yu J., Ruediger U., Kent A.D., Fallow R.F.C., Marks R.F., Weller D., Folks L., Parkin S.S.P. J. Appl. Phys. 87:2000;6854.
17. Kooy C., Enz U. Phillips. Res. Rep. 15:1960;7.