Systematic analysis and modeling of on-chip spiral inductors for complementary metal oxide semiconductor radio frequency integrated circuits applications

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 4 B, 2006, Pages 3247-3250

  Tang, Mao Chyuan ^a   Fang, Yean Kuen ^a   Yeh, Wen Kuan ^b   Chen, S H ^c   Yeh, Ta Hsun ^d  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL UNIVERSITY OF KAOHSIUNG   (Taiwan)

^c TUNG FANG INSTITUTE OF TECHNOLOGY   (Taiwan)

^d REALTEK SEMICONDUCTOR CORP   (Taiwan)

Author keywords

Frequency at peak quality factor; Peak quality factor; Self resonance frequency

Indexed keywords

CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUITS; NATURAL FREQUENCIES; SYSTEMS ANALYSIS;

FREQUENCY AT PEAK QUALITY FACTOR; PEAK QUALITY FACTOR; SELF-RESONANCE FREQUENCY;

ELECTRIC INDUCTORS;

EID: 33646905372     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.3247     Document Type: Article

References (9)

1. J. R. Long and M. A. Copeland: IEEE J. Solid-State Circuits 32 (1997) 357.
2. C. P. Yue and S. S. Wong: IEEE Trans. Electron Devices 47 (2000) 560.
3. Y. K. Koutsoyannopoulos and Y. Papananos: IEEE Trans. Circuits Syst. I 47 (2000) 699.
4. C. P. Yue, C. Ryu, J. Lau, T. H. Lee and S. S. Wong: IEDM Tech. Dig., 1996, p. 155.
5. C. P. Yue and S. S. Wong: IEEE J. Solid-State Circuits 33 (1998) 743.
6. E. Vandamme, D. Schreurs and C. Dinther: IEEE Trans. Electron Devices 48 (2001) 737.
7. A. Lord: Application Note of Cascade Microtech Europe Ltd., Oxfordshire, U.K.
8. ICCAP (Integrated Circuit Characterization and Analysis Program) 2004, Agilent Technologies, 2004.
9. J. Aguilera and R. Berenguer: Design and Test of Integrated Inductors for RF Applications (Kluwer Academic, Boston, 2003).