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Volumn 45, Issue 5 A, 2006, Pages 4187-4195

Interface structures and magnetic properties of exchanged-coupled Co/Cu multilayers sputter-grown on Ta buffers

Author keywords

Co Cu multilayers; Interface roughness; Interlayer exchange coupling; Magnetoreslstance; Orange peel effect; Superparamagnetlsm; Ta buffer

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROMAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETORESISTANCE; MULTILAYERS; SUPERPARAMAGNETISM; SURFACE ROUGHNESS; TANTALUM; THICKNESS CONTROL;

EID: 33646895448     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.4187     Document Type: Article
Times cited : (14)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.