GMR versus interfacial roughness induced from different buffers in (Co/Cu) ML

Journal of Magnetism and Magnetic Materials

Volumn 198, Issue , 1999, Pages 107-109

  El Harfaoui, M ^a,b   Le Gall, H ^a   Ben Youssef, J ^a   Pogossian, S ^a   Thiaville, A ^c   Gogol, P ^c   Qachaou, A ^b   Desvignes, J M ^a  

^a CNRS   (France)

^b IBN TOFAIL UNIVERSITY   (Morocco)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ABANDONED MINES; COBALT; COPPER; INTERFACES (MATERIALS); MAGNETORESISTANCE; MULTILAYERS; SPUTTERING; SURFACE ROUGHNESS; TEST FACILITIES; X RAY DIFFRACTION ANALYSIS;

GIANT MAGNETORESISTANCE (GMR);

MAGNETIC FILMS;

EID: 0032629997     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(98)00639-8     Document Type: Article

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