Exploring magnetic roughness in CoFe thin films

Journal of Applied Physics

Volumn 83, Issue 11, 1998, Pages 6290-6292

  Freeland, J W ^a   Chakarian, V ^a   Bussmann, K ^a   Idzerda, Y U ^a   Wende, H ^b   Kao, C C ^c  

^a NAVAL RESEARCH LABORATORY   (United States)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001344761     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367544     Document Type: Article

References (19)

1. J. F. MacKay, C. Teichert, D. E. Savage, and M. G. Lagally, Phys. Rev. Lett. 77, 3925 (1996).
2. Y. U. Idzerda, V. Chakarian, and J. W. Freeland, Synch. Radiat. News 10, 6 (1997).
3. S. Zhang and P. M. Levy, Phys. Rev. B 43, 11 048 (1991).
4. M. Suzuki and Y. Taga, Phys. Rev. B 52, 361 (1995).
5. Z. J. Zang and M. R. Scheinfein, Phys. Rev. B 52, 4263 (1995).
6. S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B 38, 2297 (1988).
7. H.-N. Yang, G.-C. Wang, and T.-M. Lu, Diffraction From Rough Surfaces and Dynamic Growth Fronts (World Scientific, River Edge, NJ, 1993).
8. K. Namikawa, M. Ando, T. Nakajima, and H. Kawata, J. Appl. Phys. 54, 4099 (1985).
9. C. Kao, J. B. Hastings, E. D. Johnson, D. P. Siddons, and G. C. Smith, Phys. Rev. Lett. 65, 373 (1990).
10. C.-C. Kao, C. T. Chen, E. D. Johnson, D. P. Siddons, H. J. Lin, G. H. Ho, G. Meigs, J.-M. Brot, S. L. Hulbert, Y. U. Idzerda, and C. Vettier, Phys. Rev. B 50, 9599 (1994).
11. J. M. Tonnerre, L. Seve, D. Raoux, G. Soullie, B. Rodmacq, and P. Wolfers, Phys. Rev. Lett. 75, 740 (1995).
12. V. Chakarian, Y. U. Idzerda, C.-C. Kao, and C. T. Chen, J. Magn. Magn. Mater. 165, 52 (1997).
13. J. W. Freeland, V. Chakarian, Y. U. Idzerda, S. Doherty, J. G. Zhu, J.-H. Park, and C.-C. Kao, Appl. Phys. Lett. 71, 276 (1997).
14. V. Chakarian, Y. U. Idzerda, G. Meigs, C. T. Chen, and C. -C. Kao, in Synchrotron Radiation Techniques in Industrial, Chemical, and Materials Science, edited by L. J. Terminello, K. L. D'Amico, and D. K. Shuh (Plenum, New York, 1996), pp. 187-205.
15. S. Hulbert, D. J. Holly, F. H. Middleton, and D. J. Wallace, Nucl. Instrum. Methods Phys. Res. A 291, 343 (1990).
16. E. D. Johnson, C. -C. Kao, and J. B. Hastings, Rev. Sci. Instrum. 63, 1443 (1992).
17. C. T. Chen, F. Sette, Y. Ma, and S. Modesti, Phys. Rev. B 42, 7262 (1990).
18. Y. U. Idzerda, C. T. Chen, H. -J. Lin, G. Meigs, G. H. Ho, and C. -C. Kao, Nucl. Instrum. Methods Phys. Res. A 347, 134 (1994).
19. V. Chakarian, Y. U. Idzerda, and C. T. Chen, Phys. Rev. B (to be published).