Conductance measurements of nanoscale regions with in situ transmission electron microscopy

Materials Science and Engineering C

Volumn 26, Issue 5-7, 2006, Pages 776-781

  Arita, Masashi ^a   Hirose, Ryusuke ^a,b   Hamada, Kouichi ^a   Takahashi, Yasuo ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b NONE

Author keywords

Coulomb staircase; Fe SrF2 granular film; Scanning tunnelling spectroscopy; SrF2; Transmission electron microscopy

Indexed keywords

DEFORMATION; ELECTRODES; ELECTRON TUNNELING; GRANULAR MATERIALS; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

COULOMB STAIRCASE; FE-SRF2 GRANULAR FILM; SCANNING TUNNELLING SPECTROSCOPY; SRF2;

NANOSTRUCTURED MATERIALS;

EID: 33646838030     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msec.2005.09.029     Document Type: Article

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