Stability of tris(8-hydroxyquinoline)-aluminum(III) films investigated by vacuum ultraviolet spectroscopic ellipsometry

Applied Physics Letters

Volumn 86, Issue 11, 2005, Pages 1-3

  Himcinschi, C ^a   Gordan, O ^a   Salvan, G ^a   Muller F ^a   Zahn, D R T ^a   Cobet, C ^b   Esser, N ^b   Braun, W ^c  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

^c HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELLIPSOMETRY; MOLECULAR BEAM EPITAXY; MORPHOLOGY; PARAMETER ESTIMATION; PROBABILITY DENSITY FUNCTION; SURFACES; SYNCHROTRON RADIATION; THIN FILMS; ULTRAVIOLET SPECTROSCOPY;

ELLIPSOMETRIC SPECTRA; ENVIRONMENTAL INSTABILITY]; TRIS(8-HYDROXYQUINOLINE)-ALUMINUM(III) FILMS; ULTRAVIOLET SPECTROSCOPIC ELLIPSOMETRY;

LIGHT EMITTING DIODES;

EID: 17944369661     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1883314     Document Type: Article

References (16)

1. C. W. Tang and S. A. Van Slyke, Appl. Phys. Lett. 51, 913 (1987).
2. G. Gu, V. Bulovic, P. E. Burrows, S. R. Forrest, and M. E. Thompson, Appl. Phys. Lett. 68, 2606 (1996).
3. L. S. Hung and C. H. Chen, Mater. Sci. Eng., R. 39, 143 (2002).
4. F. Papadimitrakopoulos, X.-M. Zhang, D. L. Thomsen, and K. A. Higgison, Chem. Mater. 8, 1363 (1996).
5. H. Aziz, Z. Popovic, S. Xie, A.-M. Hor, N. X. Hu, C. Tripp, and G. Xu, Appl. Phys. Lett. 72, 756 (1998).
6. K. A. Higginson, X.-M. Zhang, and F. Papadimitrakopoulos, Chem. Mater. 10, 1017 (1998).
7. R. J. Curry, W. P. Gillin, J. Clarkson, and D. N. Batchelder, J. Appl. Phys. 92, 1902 (2002).
8. T. Wethkamp, K. Wilmers, N. Esser, W. Richter, O. Ambacher, H. Angerer, G. Jungk, R. L. Johnson, and M. Cardona, Thin Solid Films 313, 745 (1998).
9. Optical Characterisation of Epitaxial Semiconductor Layers, edited by G. Bauer, and W. Richter (Springer, Berlin, 1996).
10. C. Himcinschi, N. Meyer, S. Hartmann, M. Gersdorff, M. Friedrich, H.-H. Johannes, W. Kowalsky, M. Schwambera, G. Strauch, M. Heuken, and D. R.T. Zahn, Appl. Phys. A: Mater. Sci. Process. 80, 551 (2005).
11. M. Baldo, M. Deitsch, P. Burrows, H. Gossenberger, M. Gerstenberger, V. Ban, and S. Forrest, Adv. Mater. (Weinheim, Ger.) 10, 1505 (1998).
12. P. E. Burrows, V. Bulovic, S. R. Forrest, L. S. Sapochak, D. M. McCarty, and M. E. Thompson, Appl. Phys. Lett. 65, 2922 (1994).
13. GAUSSIAN 98 (Revision A.1) (Gaussian, Pittsburgh, PA, 1998).
14. M. Cölle and W. Brütting, Phys. Status Solidi A 201, 1095 (2004).
15. D. Z. Garbuzov, V. Bulovic, P. E. Burrows, and S. R. Forrest, Chem. Phys. Lett. 249, 433 (1996).
16. M. Brinkmann, G. Gadret, M. Muccini, C. Taliani, N. Masciocchi, and A. Sironi, J. Am. Chem. Soc. 122, 5147 (2000).