Two-dimensional self-assembly of 1-pyrylphosphonic acid: Transfer of stacks on structured surface

Journal of the American Chemical Society

Volumn 128, Issue 17, 2006, Pages 5672-5679

  Yip, Hin Lap ^a   Ma, Hong ^a   Jen, Alex K Y ^a,b   Dong, Jianchun ^a   Parviz, Babak A ^a  

^a University of Washington   (United States)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FIELD EFFECT TRANSISTORS; FLUORESCENCE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGEN BONDS; POLYCRYSTALLINE MATERIALS; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; SPECTROSCOPIC ANALYSIS; SPIN COATING; SUPRAMOLECULAR CHEMISTRY; THIN FILMS; X RAY DIFFRACTION;

1-PYRYLPHOSPHONIC ACID; LAMINATE STRUCTURES; POLYCRYSTALLINE FILMS; STACKED FILMS;

ORGANIC ACIDS;

1 PYRYLPHOSPHONIC ACID; ALCOHOL; METHANOL; NANOPARTICLE; PHOSPHONIC ACID DERIVATIVE; PYRENE DERIVATIVE; SOLVENT; UNCLASSIFIED DRUG;

ABSORPTION SPECTROSCOPY; ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; FLUORESCENCE SPECTROSCOPY; FOURIER TRANSFORMATION; HYDROGEN BOND; INFRARED SPECTROSCOPY; SEMICONDUCTOR; SUPRAMOLECULAR CHEMISTRY; SYNTHESIS; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION;

HYDROGEN BONDING; MICROSCOPY, ATOMIC FORCE; PHOSPHONIC ACIDS; SPECTROPHOTOMETRY, ULTRAVIOLET; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 33646584505     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja0563152     Document Type: Article

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