Charge localization in polymeric metal-oxide-semiconductor capacitors

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 24, Issue 3, 2006, Pages 649-653

  Marinov, O ^a   Deen, M J ^a   Iniguez, B ^b   Ong, B ^c  

^a MCMASTER UNIVERSITY   (Canada)

^b UNIVERSITAT ROVIRA I VIRGILI   (Spain)

^c XEROX RESEARCH CENTRE OF CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); RELAXATION PROCESSES; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTING POLYMERS; SEMICONDUCTOR DEVICES; VOLTAGE MEASUREMENT;

C-V MEASUREMENTS; CHARGE ENHANCEMENT; CLASSICAL SEMICONDUCTOR THEORY; ORGANIC MATERIALS;

CAPACITORS;

EID: 33646582999     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2172929     Document Type: Article

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