Improvement of field emission properties from screen-printed CNTs cathodes by heat treatment in a C2H2/H2 gas mixture

Surface and Interface Analysis

Volumn 38, Issue 5, 2006, Pages 981-986

  Guo, P S ^a   Sun, Z ^a   Ni, S ^a   Chen, Y W ^a   Cao, Z Y ^a  

^a EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

Carbon nanotubes (CNTs); Field emission; Screen printing

Indexed keywords

CATHODES; CURRENT DENSITY; ELECTRIC FIELD EFFECTS; HEAT TREATMENT; SCANNING ELECTRON MICROSCOPY; SCREEN PRINTING;

EMISSION CURRENT DENSITIES; FIELD EMISSIONS; POSTTREATMENT METHODS; TURN-ON FIELDS;

CARBON NANOTUBES;

EID: 33646562868     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2317     Document Type: Article

References (16)

1. Choi WB, Chung DS, Kang JH, Kim HY, Jin YW, Han IT, Lee YH, Jung JE, Lee NS, Park GS, Kim JM. Appl. Phys. Lett. 1999; 75: 3129.
2. Wang QH, Yan M, Chang RPH. Appl Phys. Lett. 2001; 78: 1294.
3. Lee NS, Chung DS, Han IT, Kang JH, Choi YS, Kim HY, Park SH, Jin YW, Yi WK, Yun MJ, Jung JE, Lee CJ, You JH, You SH, JoSH, Lee CG, Kim JM. Diamond Relut. Mater. 2001; 10: 265.
4. Saito Y, Uemura S. Carbon 2000; 38: 169.
5. Li YJ, Sun Z, Lau SP, Chen GY, Tay BK. Appl. Phys. Lett. 2001; 79: 1670.
6. Bonard JM, Kind H, Stöckli T, Nilsson LO. Solid-State Electron. 2001; 45: 893.
7. Chen Y, Shaw DT. Appl. Phys. Lett. 2000; 76: 2469.
8. Vink TJ, Gillies M, Kriege JC, van de Laar HWJJ. Appl. Phys. Lett. 2003; 83: 3552.
9. Kwo JL, Yokoyama M, Wang WC, Chuang FY, Lin IN. Diamond Relat. Mater. 2000; 9: 1270.
10. Kim DH, Kim CD, Lee HR. Carbon 2004; 42: 1807.
11. Sawada A, Iriguchi M, Zhao WJ, Ochiai C, Takai M. J. Vac. Sci. Technol., B 2003; 21: 362.
12. Zhao WJ, Kawakami N, Sawada A, Takaia M. J. Vac. Sci. Technol., B 2003; 21: 1734.
13. Guo PS, Sun Z, Chen YW, Zheng ZH. Mater. Lett. 2006; 60: 966.
14. Yoon YJ, Baik HK. J. Vac. Sci. Technol., B 2001; 19: 27.
15. Nilsson L, Groning O, Emmenegger C, Kuettel O, Schaller E, Schlapbach L, Kind H, Bonard JM, Kern K. Appl. Phys. Lett. 2000; 76: 2071.
16. Bonard JM, Weiss N, Kind H, Stöckli T, Forró L, Kern K, Châtelain A. Adv. Mater. 2001; 13: 184.