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Volumn 252, Issue 13 SPEC. ISS., 2006, Pages 4728-4732

On determining the spot size for laser fluence measurements

Author keywords

PLA; PLD

Indexed keywords

CRYSTALS; IRRADIATION; LASER PULSES; LASERS; PULSED LASER DEPOSITION; SILICON WAFERS; VACUUM;

EID: 33646562218     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.07.111     Document Type: Article
Times cited : (14)

References (15)
  • 1
    • 0003592140 scopus 로고
    • Chrisey D.B., and Hubler G.K. (Eds), John Wiley & Sons, Inc., New York
    • In: Chrisey D.B., and Hubler G.K. (Eds). Pulsed Laser Deposition of Thin Films (1994), John Wiley & Sons, Inc., New York
    • (1994) Pulsed Laser Deposition of Thin Films


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.