A homogenization model for laser beam-induced current imaging and detection of non-uniformities in semiconductor arrays

Journal of Computational and Applied Mathematics

Volumn 194, Issue 2, 2006, Pages 395-408

  Fang, Weifu ^a   Ito, Kazufumi ^b   Redfern, David A ^c  

^a WEST VIRGINIA UNIVERSITY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Homogenization; Inverse problems; Laser beam induced current; LBIC; Semiconductor arrays

Indexed keywords

COMPUTER SIMULATION; INVERSE PROBLEMS; LASER BEAMS; MATHEMATICAL MODELS; QUALITY CONTROL; SEMICONDUCTOR COUNTERS; SEMICONDUCTOR DIODES;

HOMOGENIZATION; LASER BEAM-INDUCED CURRENT (LBIC); P-N JUNCTION DIODES; SEMICONDUCTOR ARRAYS;

IMAGING TECHNIQUES;

EID: 33646535337     PISSN: 03770427     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cam.2005.08.007     Document Type: Article

References (18)

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