Low temperature saturation of p-n junction laser beam induced current signals

Solid-State Electronics

Volumn 48, Issue 3, 2004, Pages 409-414

  Redfern, D A ^a   Fang, W ^b   Ito, K ^c   Musca, C A ^a   Dell, J M ^a   Faraone, L ^a  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

^b WEST VIRGINIA UNIVERSITY   (United States)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Laser beam induced current; LBIC; Non destructive characterisation; Photodiode; Temperature dependence

Indexed keywords

GAIN MEASUREMENT; LASER BEAMS; LOW TEMPERATURE OPERATIONS; NONDESTRUCTIVE EXAMINATION; PHOTODIODES;

LASER BEAM INDUCED CURRENT (LBIC) IMAGING;

SEMICONDUCTOR LASERS;

EID: 0344466636     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2003.09.008     Document Type: Article

References (8)

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