Parameter identification for semiconductor diodes by LBIC imaging

SIAM Journal on Applied Mathematics

Volumn 62, Issue 6, 2002, Pages 2149-2174

  Fang, Weifu ^a   Ito, Kazufumi ^b   Redfern, David A ^c  

^a WEST VIRGINIA UNIVERSITY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Discontinuous coefficients; Drift diffusion; Elliptic partial differential equations systems; Inverse problems; LBIC; Parameter identification; Semiconductor diodes

Indexed keywords

COMPUTER SIMULATION; LASER BEAMS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION; SEMICONDUCTOR DIODES;

LASER-BEAM-INDUCED-CURRENT (LBIC);

PARTIAL DIFFERENTIAL EQUATIONS;

EID: 0036665087     PISSN: 00361399     EISSN: None     Source Type: Journal    
DOI: 10.1137/S003613990139249X     Document Type: Article

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