SCOPUS 정보 검색 플랫폼

Czechoslovak Journal of Physics

Volumn 56, Issue 3, 2006, Pages 267-276

Structure analysis of thin iron-silicide film from φ-scan RHEED Patterson function

(5) Romanyuk, Oleksandr a Kataoka, Keita b Matsui, Fumihiko b Hattori, Ken b Daimon, Hiroshi b

a INSTITUTE OF PHYSICS (Czech Republic)

b NARA INSTITUTE OF SCIENCE AND TECHNOLOGY (Japan)

Author keywords

Iron silicide; Patterson function; RHEED; Structure analysis

Indexed keywords

EID: 33646507717 PISSN: 00114626 EISSN: 15729486 Source Type: Journal
DOI: 10.1007/s10582-006-0087-5 Document Type: Article

Times cited : (14)

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