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Volumn 16, Issue 3, 1998, Pages 1507-1510

Reflection high-energy electron diffraction during substrate rotation: A new dimension for in situ characterization

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0345498329     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589976     Document Type: Article
Times cited : (35)

References (18)
  • 9
    • 11744311445 scopus 로고    scopus 로고
    • by VTS Schwarz/FhG Erlangen
    • Safire" by VTS Schwarz/FhG Erlangen.
    • Safire
  • 11
    • 11744274501 scopus 로고    scopus 로고
    • G. Meyer-Ehmsen, in Ref. 8. p. 99
    • G. Meyer-Ehmsen, in Ref. 8. p. 99.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.