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Volumn 16, Issue 3, 1998, Pages 1507-1510
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Reflection high-energy electron diffraction during substrate rotation: A new dimension for in situ characterization
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0345498329
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.589976 Document Type: Article |
Times cited : (35)
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References (18)
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