Heavy ion effects on configuration logic of virtex FPGAs

Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005

Volumn 2005, Issue , 2005, Pages 49-53

  Alderighi, M ^a   Candelori, A ^b   Casini, F ^c   D'Angelo, S ^a   Mancini, M ^a   Paccagnella, A ^d   Pastore, S ^c   Sechi, G R ^a  

^a INAF IASF MILANO   (Italy)

^b SEZIONE DI PADOVA   (Italy)

^c Sanitas EG srl   (Italy)

^d UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; HEAVY IONS; INTEGRATED CIRCUIT LAYOUT; SENSITIVITY ANALYSIS;

CONFIGURATION LOGIC; RADIATION TESTS; SEU SENSITIVITY; VIRTEX DEVICES;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 33646491364     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2005.31     Document Type: Conference Paper

References (11)

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