Importance of second-order piezoelectric effects in zinc-blende semiconductors

Physical Review Letters

Volumn 96, Issue 18, 2006, Pages

  Bester, Gabriel ^a   Wu, Xifan ^b   Vanderbilt, David ^b   Zunger, Alex ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); CRYSTAL DEFECTS; ELECTRIC FIELD EFFECTS; PIEZOELECTRICITY; QUANTUM THEORY; SEMICONDUCTOR QUANTUM WELLS; STRAIN; ZINC;

CRYSTAL DEFORMATION; DENSITY-FUNCTIONAL THEORY; ZINC-BLENDE SEMICONDUCTORS;

SEMICONDUCTOR MATERIALS;

EID: 33646462994     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.187602     Document Type: Article

References (37)

1. W.G. Cady, Piezoelectricity (McGraw-Hill, New York, 1946).
2. G. Arlt and P. Quadflieg, Phys. Status Solidi PHSSAK 0031-8957 25, 323 (1968).
3. R.M. Martin, Phys. Rev. B PLRBAQ 0556-2805 5, 1607 (1972). 10.1103/PhysRevB.5.1607
4. K. Hubner, Phys. Status Solidi B PSSBBD 0370-1972 57, 627 (1973).
5. W.A. Harrison, Phys. Rev. B PLRBAQ 0556-2805 10, 767 (1974). 10.1103/PhysRevB.10.767
6. R.D. King-Smith and D. Vanderbilt, Phys. Rev. B PRBMDO 0163-1829 47, 1651 (1993); 10.1103/PhysRevB.47.1651
7. D. Vanderbilt, J. Phys. Chem. Solids JPCSAW 0022-3697 61, 147 (2000). 10.1016/S0022-3697(99)00273-5
8. S. deGironcoli, S. Baroni, and R. Resta, Phys. Rev. Lett. 62, 2853 (1989); PRLTAO 0031-9007 10.1103/PhysRevLett.62.2853
9. A. DalCorso, R. Resta, and S. Baroni, Phys. Rev. B PRBMDO 0163-1829 47, 16252 (1993); 10.1103/PhysRevB.47.16252
10. F. Bernardini, V. Fiorentini, and D. Vanderbilt, Phys. Rev. B PRBMDO 0163-1829 56, R10024 (1997); 10.1103/PhysRevB.56.R10024
11. F. Bernardini and V. Fiorentini, Phys. Rev. B PRBMDO 0163-1829 64, 085207 (2001); 10.1103/PhysRevB.64.085207
12. A. Al-Yacoub, L. Bellaiche, and S.-H. Wei, Phys. Rev. Lett. PRLTAO 0031-9007 89, 057601 (2002). 10.1103/PhysRevLett.89.057601
13. D.L. Smith and C. Mailhiot, Rev. Mod. Phys. 62, 173 (1990). RMPHAT 0034-6861 10.1103/RevModPhys.62.173
14. O. Stier, M. Grundmann, and D. Bimberg, Phys. Rev. B PRBMDO 0163-1829 59, 5688 (1999). 10.1103/PhysRevB.59.5688
15. A.D. Andreev and E.P. O'Reilly, Phys. Rev. B PRBMDO 0163-1829 62, 15851 (2000). 10.1103/PhysRevB.62.15851
16. M. Holm, M.E. Pistol, and C. Pryor, J. Appl. Phys. 92, 932 (2002). JAPIAU 0021-8979 10.1063/1.1486021
17. W. Sheng and J.P. Leburton, Phys. Rev. B PRBMDO 0163-1829 67, 125308 (2003). 10.1103/PhysRevB.67.125308
18. V. Ranjan, G. Allan, C. Priester, and C. Delerue, Phys. Rev. B PRBMDO 0163-1829 68, 115305 (2003). 10.1103/PhysRevB.68.115305
19. G. Bester and A. Zunger, Phys. Rev. B PRBMDO 0163-1829 71, 045318 (2005). 10.1103/PhysRevB.71.045318
20. R.A. Hogg, Phys. Rev. B PRBMDO 0163-1829 48, R8491 (1993). 10.1103/PhysRevB.48.8491
21. J.L. Sanchez-Rojas, A. Sacedon, F. Gonzalez-Sanz, E. Calleja, and E. Munoz, Appl. Phys. Lett. 65, 2042 (1994). APPLAB 0003-6951 10.1063/1.112787
22. T.B. Bahder, R.L. Tober, and J.D. Bruno, Phys. Rev. B PRBMDO 0163-1829 50, R2731 (1994). 10.1103/PhysRevB.50.2731
23. P. Ballet, Thin Solid Films 336, 354 (1998). THSFAP 0040-6090 10.1016/S0040-6090(98)01253-X
24. P. Ballet, Phys. Rev. B PRBMDO 0163-1829 59, R5308 (1999). 10.1103/PhysRevB.59.R5308
25. S. Cho, J. Appl. Phys. 90, 915 (2001). JAPIAU 0021-8979 10.1063/1.1379563
26. J.J. Sanchez, J. Appl. Phys. 91, 3002 (2002); JAPIAU 0021-8979 10.1063/1.1445278
27. S. Cho, Phys. Status Solidi A PSSABA 0031-8965 195, 260 (2003). 10.1002/pssa.200306269
28. ABINIT is a common project of the Université Catholique de Louvain, Corning Incorporated, and other contributors (http://www.abinit.org);
29. see X. Gonze, Comput. Mater. Sci. CMMSEM 0927-0256 25, 478 (2002). 10.1016/S0927-0256(02)00325-7
30. X. Wu, D. Vanderbilt, and D.R. Hamann, Phys. Rev. B PRBMDO 0163-1829 72, 035105 (2005). 10.1103/PhysRevB.72.035105
31. J. Bernard and A. Zunger, Appl. Phys. Lett. 65, 165 (1994). APPLAB 0003-6951 10.1063/1.112660
32. R. Resta, Rev. Mod. Phys. 66, 899 (1994). RMPHAT 0034-6861 10.1103/RevModPhys.66.899
33. N. Marzari and D. Vanderbilt, Phys. Rev. B PRBMDO 0163-1829 56, 12847 (1997). 10.1103/PhysRevB.56.12847
34. A. Baldereschi, S. Baroni, and R. Resta, Phys. Rev. Lett. 61, 734 (1988). PRLTAO 0031-9007 10.1103/PhysRevLett.61.734
35. C.H. Chan, Appl. Phys. Lett. 72, 1208 (1998); APPLAB 0003-6951 10.1063/1.121015
36. S.A. Dickey, Microelectron. Eng. 43-44, 171 (1998); MIENEF 0167-9317 10.1016/S0167-9317(98)00160-9
37. J.D. Bruno and R.L. Tober, J. Appl. Phys. 85, 2221 (1999). JAPIAU 0021-8979 10.1063/1.369530