Electron-beam (5-10 keV) damage in triplite-group phosphates: Consequences for electron-microprobe analysis of fluorine

American Mineralogist

Volumn 91, Issue 4, 2006, Pages 503-510

  Fialin, Michel ^a   Chopin, Christian ^b  

^a CNRS   (France)

^b LABORATOIRE DE GÉOLOGIE   (France)

Author keywords

Crystal structure; Electron microprobe; Electron microscopy; Fluorine analysis; Point defects in solids; Polytypism; Triplite group phosphates

Indexed keywords

ALKALI HALIDES; CRYSTAL ATOMIC STRUCTURE; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DESORPTION; ELECTRON BEAMS; ELECTRON MICROSCOPY; ELECTRONIC STRUCTURE; ELECTRONS; FLUORINE; FLUORINE COMPOUNDS; ION SOURCES; IONIC CONDUCTION IN SOLIDS; IONS; IRRADIATION; PHOSPHATES; POINT DEFECTS; RADIATION CHEMISTRY; SURFACE CHEMISTRY;

ALKALINE EARTH FLUORIDES; DEFECTS IN SOLIDS; ELECTRON MICROPROBES; ELECTRON STIMULATED DESORPTION; FLUORINE ANALYSIS; POLYTYPISM; SURFACE POTENTIAL BARRIER; TRANSIENT MOLECULAR IONS;

ELECTRON PROBE MICROANALYSIS;

CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELECTRON PROBE ANALYSIS; FLUORINE; LATTICE DYNAMICS; POLYTYPISM;

EID: 33646454924     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2006.1926     Document Type: Article

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