Charge dynamics of MgO single crystals subjected to KeV electron irradiation

Journal of Applied Physics

Volumn 95, Issue 8, 2004, Pages 4117-4124

  Boughariou, A ^a   Blaise, G ^b   Braga, D ^b   Kallel, A ^a  

^a UNIVERSITY OF SFAX   (Tunisia)

^b UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ANNEALING; BACKSCATTERING; CRYSTAL ORIENTATION; CURRENT DENSITY; ELECTRIC FIELD EFFECTS; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON IRRADIATION; INSULATING MATERIALS; MAGNESIUM COMPOUNDS; POLISHING; RELAXATION PROCESSES; SCANNING ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

CHARGE TRAPPING; CROSSOVER ENERGIES; SECONDARY ELECTRON EMMISION (SEE); SECONDARY ELECTRONS;

SINGLE CRYSTALS;

EID: 2342626084     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1650881     Document Type: Article

References (26)

1. U. Schönberger and F. Aryasetiawan, Phys. Rev. B 52, 8788 (1995).
2. E. Castanier and C. Noguera, Surf. Sci. 364, 1 (1996).
3. P. Jonnard, F. Vergand, C. Bonnelle, E. Orgaz, and M. Gupta, Phys. Rev. B 57, 12 111 (1998).
4. P. V. Sushko, A. L. Shluger, and C. R. A. Catlow, Surf. Sci. 450, 153 (2000).
5. C. Coudray and G. Biaise, J. Appl. Phys. (to be published).
6. Y-n. Xu and W. Y. Ching, Phys. Rev. B 43, 4461 (1991).
7. N. Farhat, T. Ditchi, S. Holé, and J. Lewiner, J. Appl. Phys. 91, 5296 (2002).
8. N. R. Whetten and A. B. Laponsky, J. Appl. Phys. 28, 515 (1957).
9. N. R. Whetten and A. B. Laponsky, J. Appl. Phys. 3, 432 (1959).
10. N. R. Whetten, J. Appl. Phys. 35, 3279 (1964).
11. N. R. Whetten and A. B. Laponsky, Phys. Rev. 107, 1521 (1957).
12. P. Wargo, B. V. Haxby, and W. G. Shepherd, J. Appl. Phys. 27, 1311 (1956).
13. T. Urade, T. Iemori, M. Osawa, N. Nakayama, and I. Monta, IEEE Trans. Electron Devices 23, 313 (1976).
14. O. Sahni and C. Lanza, J. Appl. Phys. 47, 1337 (1976).
15. Min Sup Hur, Jae Koo Lee, Hyun Chul Kim, and Bong Koo Kang, IEEE Trans. Plasma Sci. 29, 861 (2001).
16. J. Cazaux, in Ionization of Solids by Heavy Particles, edited by R. A. Baragiola (Plenum Press, New York, 1993), pp. 325-350.
17. R. G. Lye, Phys. Rev. 99, 1647 (1955).
18. P. B. Moller and J. He, Nucl. Instrum. Methods Phys. Res. B 17, 137 (1986).
19. J. Cazaux, K. H. Kim, O. Jbara, and G. Salace, J. Appl. Phys. 70, 960 (1991).
20. D. Braga, G. Blaise, and B. Poumellec, G. I. T. Imaging and Microscopy, 2003, pp. 28-30.
21. G. Biaise and D. Braga, Proceedings of the 4th International Conference on Electric Charges in Non-Conductive Materials, Tours, France (2001). (Société Française du Paris, France, Vide, Science, Technique et Applications, Numéro Spécial, 2001), pp. 326-329.
22. G. Biaise, see Reference 22, p. 31.
23. G. Biaise and C. Le Gressus, C. R. Acad. Sci., Ser. II: Mec., Phys., Chim., Sci. Terre Univers 314, 1017 (1992).
24. B. Vallayer, G. Biaise, and D. Treheux, Rev. Sci. Instrum. 70, 3102 (1999).
25. E. H. Choi, H. J. Oh, Y. G. Kim, J. J. Ko, J. Y. Lim, J. G. Kim, D. I. Kim, G. Cho, and S. O. Kang, Jpn. J. Appl. Phys., Part l 37, 7015 (1998).
26. L. Reimer, H. G. Badde, H. Seidel, and Z. Angew, Phys. Rev. 31, 145 (1971).