Measurement of adhesion energies and Young's modulus in thin polymer films using a novel axi-symmetric peel test geometry

European Physical Journal E

Volumn 19, Issue 4, 2006, Pages 453-459

  Raegen, A N ^a   Dalnoki Veress, K ^a   Wan, K T ^b   Jones, R A L ^c  

^a MCMASTER UNIVERSITY   (Canada)

^b Architectural and Environmental Engineering   (United States)

^c UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ELASTIC MODULI; POLYMERIC MEMBRANES; SILICA; THERMAL EFFECTS; THIN FILMS;

ADHESION ENERGIES; AXI-SYMMETRIC DEFORMATION; THIN POLYMER FILMS;

POLYMERS;

POLYMER; POLYSTYRENE DERIVATIVE;

ADHESION; ANISOTROPY; ARTICLE; ARTIFICIAL MEMBRANE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; ELASTICITY; ENERGY TRANSFER; HARDNESS; INSTRUMENTATION; MATERIALS TESTING; MECHANICAL STRESS; MEMBRANE FLUIDITY; METHODOLOGY; SURFACE PROPERTY;

ADHESIVENESS; ANISOTROPY; COMPUTER SIMULATION; ELASTICITY; ENERGY TRANSFER; HARDNESS; HARDNESS TESTS; MATERIALS TESTING; MEMBRANE FLUIDITY; MEMBRANES, ARTIFICIAL; MODELS, CHEMICAL; MODELS, MOLECULAR; POLYMERS; POLYSTYRENES; STRESS, MECHANICAL; SURFACE PROPERTIES;

EID: 33646402949     PISSN: 12928941     EISSN: 1292895X     Source Type: Journal    
DOI: 10.1140/epje/i2005-10069-7     Document Type: Article

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