A theoretical and numerical study of a thin clamped circular film under an external load in the presence of a tensile residual stress

Thin Solid Films

Volumn 425, Issue 1-2, 2003, Pages 150-162

  Wan, Kai Tak ^a,b   Guo, Shu ^a   Dillard, David A ^a  

^a State University   (United States)

^b MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

Blister; Residual stress; Thin film

Indexed keywords

FINITE ELEMENT METHOD; HYDROSTATIC PRESSURE; RESIDUAL STRESSES; RIGIDITY; STRAIN MEASUREMENT; TENSILE STRESS;

VIBRATIONAL HOLOGRAPHIC METHODS;

THIN FILMS;

EID: 0037415867     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01103-3     Document Type: Article

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