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Volumn 892, Issue , 2006, Pages 723-727

Microstructure and strain-free lattice parameters of ScxGa 1-xN films

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIA; CONCENTRATION (PROCESS); FILM GROWTH; LATTICE CONSTANTS; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

EID: 33646386161     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (15)
  • 14
    • 0004006717 scopus 로고    scopus 로고
    • London: Imperial College Press
    • nd Ed. (London: Imperial College Press, 2004), p. 194
    • (2004) nd Ed. , pp. 194
    • Fewster, P.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.