SCOPUS 정보 검색 플랫폼

Volumn 3, Issue 4, 2006, Pages 1001-1004

Influence of annealing on the structural and magnetic properlies of epitaxial Zn1-xMnxO films grown by MOCVD on sapphire

(5) Chikoidze, E a,b Von Bardeleben, H J c Dumont, Y a Jomard, F a Gorochov, O a

a LABORATOIRE DES SCIENCES DU CLIMAT ET DE L ENVIRONNEMENT (France)

b TBILISI STATE UNIVERSITY (Georgia)

c UNIVERSITÉ PARIS DESCARTES (France)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; MAGNETIC PROPERTIES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PARAMAGNETIC RESONANCE; RAPID THERMAL ANNEALING; SAPPHIRE; TEMPERATURE DISTRIBUTION; THIN FILMS; X RAY DIFFRACTION ANALYSIS; ANTIFERROMAGNETISM; MANGANESE; X RAY DIFFRACTION; ZINC;

ANNEALED FILMS; ANTIFERROMAGNETIC PHASE; INTRINSIC DEFECTS;

ZINC OXIDE; ANNEALING;

68.55.JK; 75.50.EE; 75.50.PP; 76.30.LH; 81.40.EF;

EID: 33646179586 PISSN: 16101634 EISSN: None Source Type: Conference Proceeding
DOI: 10.1002/pssc.200564651 Document Type: Conference Paper

Times cited : (2)

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