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Volumn 83, Issue 4-9 SPEC. ISS., 2006, Pages 699-702

Tin based laser-produced plasma source development for EUVL

Author keywords

Calculated spectra; Conversion efficiency; Extreme ultraviolet lithography; Laser produced plasma

Indexed keywords

BANDWIDTH; CRYSTAL ATOMIC STRUCTURE; LASER PULSES; PHASE TRANSITIONS; PLASMA SOURCES; TIN;

EID: 33646045041     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2005.12.032     Document Type: Article
Times cited : (14)

References (16)
  • 1
    • 33646071122 scopus 로고    scopus 로고
    • P. Silverman, 1st EUVL Source Workshop, ISMT, Dallas, 2002.
  • 7
    • 33646059418 scopus 로고    scopus 로고
    • K. Nishihara et al., in: 3rd Int. Sematech EUVL Symp., Miyazaki, Japan, 2004.
  • 8
    • 33646046091 scopus 로고    scopus 로고
    • G. Derra, P. Zink, T. Krücken, A. Weber, and J. Pankert, Int. Sematech, EUV Source Workshop, San Jose, 2005.
  • 16
    • 33646054775 scopus 로고    scopus 로고
    • J. White, P. Hayden, P. Dunne, A. Cummings, N. Murphy, P. Sheridan, G. O'Sullivan, J. Appl. Phys., accepted for publication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.