Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniques

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 246, Issue 1, 2006, Pages 45-49

  Johannessen, B ^a   Kluth, P ^a   Cookson, D J ^b   Foran, G J ^c   Ridgway, M C ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b AUSTRALIAN SYNCHROTRON   (Australia)

^c AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

EXAFS; Ion implantation; Nanocrystals; SAXS

Indexed keywords

ANNEALING; COPPER; SILICON COMPOUNDS; SURFACE TENSION; SYNCHROTRONS; THIN FILMS; X RAY ANALYSIS; X RAY SCATTERING;

BONDLENGTH CONTRACTIONS; EXTENDED X-RAY ABSORPTION FINE STRUCTURE (EXAFS); ION IMPLANTATIONS; SMALL ANGLE X-RAY SCATTERING (SAXS);

NANOSTRUCTURED MATERIALS;

EID: 33645886358     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.12.015     Document Type: Article

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