SCOPUS 정보 검색 플랫폼

Volumn 134, Issue 1-6, 1997, Pages 301-309

Simple reflection scanning near-field optical microscope using the back reflected light inside the laser cavity as detection mode

b CNES (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEMODULATION; HELIUM NEON LASERS; LIGHT REFLECTION; OPTICAL BEAM SPLITTERS; OPTICAL MICROSCOPY; SEMICONDUCTOR LASERS;

EXPLOITABLE IMAGES; LASER CAVITY; OPTICAL DETECTION; SCANNING NEAR FIELD OPTICAL MICROSCOPE (SNOM);

MICROSCOPES;

EID: 0030786841 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/S0030-4018(96)00563-9 Document Type: Article

Times cited : (6)

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