Temperature square dependence of the low frequency 1/f charge noise in the Josephson junction qubits

Physical Review Letters

Volumn 96, Issue 13, 2006, Pages

  Astafiev, O ^a,b   Pashkin, Yu A ^a,b   Nakamura, Y ^a,b   Yamamoto, T ^a,b   Tsai, J S ^a,b  

^a NEC CORPORATION   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEGENERACY; DEPHASING; LOW FREQUENCY 1/F CHARGE NOISE; QUBITS;

ELECTRIC CHARGE; ELECTROSTATICS; OSCILLATIONS; QUANTUM ELECTRONICS; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS;

JOSEPHSON JUNCTION DEVICES;

EID: 33645513932     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.137001     Document Type: Article

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