Understanding of epitaxial alignment in NiSi thin films on A (001) SI surface using edge-to-edge matching model

Proceedings of an International Conference on Solid-Solid Phase Transformations in Inorganic Materials 2005

Volumn 1, Issue , 2005, Pages 145-151

  Zhang, M X ^a   Kelly, P M ^a   Detavernier, C ^b  

^a UNIVERSITY OF QUEENSLAND   (Australia)

^b GHENT UNIVERSITY   (Belgium)

Author keywords

Edge to edge matching; Epitaxial alignment; Single crystal; Thin films

Indexed keywords

MATHEMATICAL MODELS; NICKEL COMPOUNDS; PHASE TRANSITIONS; SILICON COMPOUNDS;

EDGE-TO-EDGE MATCHING; EPITAXIAL ALIGNMENT; ORIENTATION RELATIONSHIPS (OR);

THIN FILMS;

EID: 33645233805     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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