Symmetrization of diffraction peak profiles measured with a high-resolution synchrotron X-ray powder diffractometer

Journal of Applied Crystallography

Volumn 39, Issue 1, 2006, Pages 90-100

  Ida, T ^a   Hibino, H ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33645134010     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889805040318     Document Type: Article

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