Correction for counting losses in X-ray diffractometry

Journal of Applied Crystallography

Volumn 38, Issue 3, 2005, Pages 426-432

  Ida, T ^a   Iwata, Y ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 20444505120     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889805005637     Document Type: Article

References (7)

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2. Cousins, C. S. G. (1994). J. Appl. Cryst. 27, 159-163.
3. Müller, J. W. (1973). Nucl. Instrum. Methods, 112, 47-57.
4. Omote, K. (1990). Nucl. Instrum. Methods Phys. Res. Sect. A, 293, 582-588.
5. Quintana, J. P. (1991). J. Appl. Cryst. 24, 261-262.
6. Reed, S. J. B. (1972). J. Phys. E, 5, 994-996.
7. Toraya, H., Hibino, H. & Ohsumi, K. (1996). J. Synchrotron Rad. 3, 75-83.