Connection of segmented intensity data measured with a multiple-detector system for powder diffractometry

Journal of Applied Crystallography

Volumn 38, Issue 5, 2005, Pages 795-803

  Ida, T ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 26844437170     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889805021709     Document Type: Article

References (7)

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2. Ida, T., Hibino, H. & Toraya, H. (2001). J. Appl. Cryst. 34, 144-151.
3. Ida, T. & Toraya, H. (2002). J. Appl. Cryst. 35, 58-68.
4. Ida, T. & Iwata, Y. (2005). J. Appl. Cryst. 38, 426-432.
5. Kaps, W. H., Ihringer, J., Prandl, W. & Schilling, M. (1999). XVIIIth IUCr Congress Glasgow, P13.01.016, S. 239-240.
6. Stokes, A. R. (1948). Proc. Phys. Soc. 61, 382-391.
7. Toraya, H., Hibino, H. & Ohsumi, K. (1996). J. Synchrotron Rad. 3, 75-83.