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Volumn 20, Issue 1, 2006, Pages 69-86

A novel cumulative fatigue damage model for electronically-conductive adhesive joints under variable loading

Author keywords

Adhesive joints, cumulative fatigue damage; Cyclic creep; Cyclic loading; Electronically conductive adhesives; Endurance limit; Fatigue life predictive model; Fracture; P N curve

Indexed keywords

CREEP; FATIGUE OF MATERIALS; FRACTURE; LOADS (FORCES); MATHEMATICAL MODELS; ADHESIVE JOINTS; CREEP TESTING; ELECTRIC CONDUCTIVITY; STRESS ANALYSIS;

EID: 33645067640     PISSN: 01694243     EISSN: None     Source Type: Journal    
DOI: 10.1163/156856106775212404     Document Type: Article
Times cited : (24)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.