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Volumn 290, Issue 1, 2006, Pages 166-170
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Optimization of (112̄0) a-plane GaN growth by MOCVD on (11̄02) r-plane sapphire
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Author keywords
A3. Metalorganic chemical vapor deposition; B1. Nitrides; B1. Semiconducting III V materials
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL GROWTH;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
NITRIDES;
OPTIMIZATION;
POLARIZATION;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR MATERIALS;
X RAY DIFFRACTION ANALYSIS;
GAN FILMS;
HIGH TEMPERATURE CONDITIONS;
SEMICONDUCTING III-V MATERIALS;
SURFACE UNDULATIONS;
GALLIUM NITRIDE;
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EID: 33645029832
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2006.01.008 Document Type: Article |
Times cited : (143)
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References (10)
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