Measurement of atomic diffraction phases induced by material gratings

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 73, Issue 3, 2006, Pages

  Perreault, John D ^a   Cronin, Alexander D ^a  

^a University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM-SURFACE INTERACTIONS; ATOMIC DIFFRACTION PHASES; DE BROGLIE WAVES; SILICON NITRIDE GRATINGS;

INTERFEROMETERS; MEASUREMENT THEORY; PARTICLE OPTICS; PHASE SHIFT; SILICON NITRIDE; SODIUM;

DIFFRACTION GRATINGS;

EID: 33645002317     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.73.033610     Document Type: Article

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