Using atomic diffraction of Na from material gratings to measure atom-surface interactions

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 71, Issue 5, 2005, Pages

  Perreault, John D ^a,b   Cronin, Alexander D ^a,b   Savas, T A ^b  

^a UNIVERSITY OF ARIZONA   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FRESNEL OPTICAL THEORY; MATERIAL GRATINGS; MATTER-WAVE DIFFRACTION PEAKS; SODIUM ATOMS;

DIFFRACTION GRATINGS; MOLECULAR STRUCTURE; OPTICAL COLLIMATORS; PHASE SHIFT; QUANTUM OPTICS; SILICON NITRIDE; VAN DER WAALS FORCES;

SODIUM;

EID: 26944435219     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.71.053612     Document Type: Article

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