Modeling and experimental verification of substrate coupling and isolation techniques in mixed-signal ICs on a lightly-doped substrate

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn 2005, Issue , 2005, Pages 280-283

  Van Der Plas, G ^a   Soens, C ^a,b   Badaroglu, M ^a   Wambacq, P ^a,b   Donnay, S ^a  

^a IMEC   (Belgium)

^b VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHTLY-DOPED SUBSTRATE; MIXED-SIGNAL ICS; PERFORMANCE DEGRADATION; SUBSTRATE NOISE GENERATION;

DOPING (ADDITIVES); NATURAL FREQUENCIES; PERFORMANCE; SIGNAL THEORY; SPURIOUS SIGNAL NOISE; SUBSTRATES;

INTEGRATED CIRCUITS;

EID: 33644970632     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIC.2005.1469386     Document Type: Conference Paper

References (12)

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