Performance degradation of an LC-tank VCO by impact of digital switching noise

ESSCIRC 2004 - Proceedings of the 30th European Solid-State Circuits Conference

Volumn , Issue , 2004, Pages 119-122

  Soens, C ^a,b   Van Der Plas, G ^a   Wambacq, P ^a,b   Donnay, S ^a  

^a imec   (Belgium)

^b VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY RANGE; GROUND LINES; SINGLE CHIPS; SUBSTRATE NOISE;

CMOS INTEGRATED CIRCUITS; ELECTRIC CONDUCTIVITY; FREQUENCIES; SIGNAL PROCESSING; SPURIOUS SIGNAL NOISE; SUBSTRATES; SWITCHING;

VARIABLE FREQUENCY OSCILLATORS;

EID: 17644373120     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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