메뉴 건너뛰기




Volumn 35, Issue 4, 2005, Pages 425-430

Properties of transparent oxide thin films prepared by plasma deposition

Author keywords

Hot target; Sputtering process; Titanium oxide; Transparent thin film

Indexed keywords

CRYSTALLIZATION; DEPOSITION; OPTICAL PROPERTIES; PLASMAS; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS; LIGHT TRANSMISSION; MAGNETRON SPUTTERING; MICROSTRUCTURE; SILICON COMPOUNDS; SUBSTRATES; X RAY DIFFRACTION;

EID: 33644967983     PISSN: 00785466     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (11)
  • 3
    • 0032108846 scopus 로고    scopus 로고
    • Low-pressure magnetron sputtering
    • MUSIL J., Low-pressure magnetron sputtering, Vacuum 50(3-4), 1998, pp. 363-72.
    • (1998) Vacuum , vol.50 , Issue.3-4 , pp. 363-372
    • Musil, J.1
  • 4
    • 0032028412 scopus 로고    scopus 로고
    • Recent advances in magnetron sputtering technology
    • MUSIL J., Recent advances in magnetron sputtering technology, Surface and Coatings Technology 100-101(1-3), 1998, pp. 280-6.
    • (1998) Surface and Coatings Technology , vol.100-101 , Issue.1-3 , pp. 280-286
    • Musil, J.1
  • 5
    • 0033308741 scopus 로고    scopus 로고
    • Influence of the target temperature on a reactive sputtering process
    • BILLARD A., MERCS D., PERRY F., FRANTZ C., Influence of the target temperature on a reactive sputtering process, Surface and Coatings Technology 116-119, 1999, pp. 721-6.
    • (1999) Surface and Coatings Technology , vol.116-119 , pp. 721-726
    • Billard, A.1    Mercs, D.2    Perry, F.3    Frantz, C.4
  • 7
    • 33644980109 scopus 로고    scopus 로고
    • Joint Committee on Powder Diffraction Standards, Card No 21-1272
    • Joint Committee on Powder Diffraction Standards, Card No 21-1272.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.