-
1
-
-
0032653080
-
2 thin films
-
2 thin films. Thin Solid Films 340(1), 1999, pp. 110-6.
-
(1999)
Thin Solid Films
, vol.340
, Issue.1
, pp. 110-116
-
-
Aarik, J.1
Aidla, A.2
Kiisler, A.-A.3
Uustare, T.4
Sammelselg, V.5
-
2
-
-
2442480291
-
2 semiconducting thin films sputtered on silicon
-
2 semiconducting thin films sputtered on silicon, Optica Applicata 33(4), 2003, pp. 661-8.
-
(2003)
Optica Applicata
, vol.33
, Issue.4
, pp. 661-668
-
-
Domaradzki, J.1
Prociow, E.L.2
Kaczmarek, D.3
Berlicki, T.4
Kudrawiec, R.5
Mlsiewicz, J.6
Mielcarek, W.7
-
3
-
-
0032108846
-
Low-pressure magnetron sputtering
-
MUSIL J., Low-pressure magnetron sputtering, Vacuum 50(3-4), 1998, pp. 363-72.
-
(1998)
Vacuum
, vol.50
, Issue.3-4
, pp. 363-372
-
-
Musil, J.1
-
4
-
-
0032028412
-
Recent advances in magnetron sputtering technology
-
MUSIL J., Recent advances in magnetron sputtering technology, Surface and Coatings Technology 100-101(1-3), 1998, pp. 280-6.
-
(1998)
Surface and Coatings Technology
, vol.100-101
, Issue.1-3
, pp. 280-286
-
-
Musil, J.1
-
5
-
-
0033308741
-
Influence of the target temperature on a reactive sputtering process
-
BILLARD A., MERCS D., PERRY F., FRANTZ C., Influence of the target temperature on a reactive sputtering process, Surface and Coatings Technology 116-119, 1999, pp. 721-6.
-
(1999)
Surface and Coatings Technology
, vol.116-119
, pp. 721-726
-
-
Billard, A.1
Mercs, D.2
Perry, F.3
Frantz, C.4
-
6
-
-
28844503220
-
Microstructure of nanocrystalline titanium dioxide thin films deposited on silicon
-
[Ed.] J. Osvald, S. Hascik, IEEE 04EX867 (Smolenice Castle, Slovakia)
-
DOMARADZKI J., PROCIOW E., KACZMAREK D., MIELCAREK W., Microstructure of nanocrystalline titanium dioxide thin films deposited on silicon, [In] The Fifth International Conference on Advanced Semiconductor Devices and Microsystems ASDAM 2004, [Ed.] J. Osvald, S. Hascik, IEEE 04EX867 (Smolenice Castle, Slovakia, 2004), pp. 119-22.
-
(2004)
The Fifth International Conference on Advanced Semiconductor Devices and Microsystems ASDAM 2004
, pp. 119-122
-
-
Domaradzki, J.1
Prociow, E.2
Kaczmarek, D.3
Mielcarek, W.4
-
7
-
-
33644980109
-
-
Joint Committee on Powder Diffraction Standards, Card No 21-1272
-
Joint Committee on Powder Diffraction Standards, Card No 21-1272.
-
-
-
-
8
-
-
0034498663
-
2 amorphous films prepared by PVD method
-
2 amorphous films prepared by PVD method, Physica Status Solidi A: Applied Research 182(2), 2000, pp. 727-36.
-
(2000)
Physica Status Solidi A: Applied Research
, vol.182
, Issue.2
, pp. 727-736
-
-
Pal, M.1
Tsujigami, Y.2
Yoshikado, A.3
Sakata, H.4
-
9
-
-
0035500933
-
2 films on structural and optical properties
-
2 films on structural and optical properties, Applied Physics A: Materials Science and Processing 73(5), 2001, pp. 595-600.
-
(2001)
Applied Physics A: Materials Science and Processing
, vol.73
, Issue.5
, pp. 595-600
-
-
Won, D.J.1
Wang, C.H.2
Jang, H.K.3
Choi, D.J.4
-
11
-
-
0037125018
-
2 thin films prepared by r.f. magnetron sputtering method
-
2 thin films prepared by r.f. magnetron sputtering method, Surface and Coatings Technology 155(2-3), 2002, pp. 141-5.
-
(2002)
Surface and Coatings Technology
, vol.155
, Issue.2-3
, pp. 141-145
-
-
Wang, T.M.1
Zheng, S.K.2
Hao, W.C.3
Wang, C.4
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