Electrical and optical properties of MoO3-TeO2 amorphous films prepared by PVD method

Physica Status Solidi (A) Applied Research

Volumn 182, Issue 2, 2000, Pages 727-736

  Pal, M ^a   Tsujigami, Y ^b   Yoshikado, A ^b   Sakata, H ^a  

^a TOKAI UNIVERSITY   (Japan)

^b Toyo Precision Parts Mfg Co Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; MOLYBDENUM COMPOUNDS; OPTICAL PROPERTIES; TELLURIUM COMPOUNDS; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

VACUUM DEPOSITION METHODS;

AMORPHOUS ALLOYS;

EID: 0034498663     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200012)182:2<727::AID-PSSA727>3.0.CO;2-A     Document Type: Article

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