Variables sampling plans for Weibull distributed lifetimes under sudden death testing

IEEE Transactions on Reliability

Volumn 55, Issue 1, 2006, Pages 53-58

  Jun, Chi Hyuck ^a   Balamurali, S ^a   Lee, Sang Ho ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Double sampling; Lot acceptance; Operating characteristic curve; Single sampling

Indexed keywords

PARAMETER ESTIMATION; PROBABILITY; SAMPLING; WEIBULL DISTRIBUTION;

DOUBLE SAMPLING; LOT ACCEPTANCE; OPERATING CHARACTERISTIC CURVE; SINGLE SAMPLING;

RELIABILITY THEORY;

EID: 33644881077     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2005.863802     Document Type: Article

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