Thermal noise and bit error rate limits in nanoscale memories

Electronics Letters

Volumn 42, Issue 5, 2006, Pages 279-280

  Forbes, L ^a   Mudrow, M ^a   Wanalertlak, W ^a  

^a 1148 Kelley Engineering Center Corvallis   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; NANOSTRUCTURED MATERIALS; THERMAL NOISE;

NANOSCALE MEMORIES;

DATA STORAGE EQUIPMENT;

EID: 33644769185     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20063803     Document Type: Article

References (9)

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