Temperature dependence of noise equivalent temperature change of Pt/Si/p-Si composites in the 3-5 μm wavelength range

Applied Physics Letters

Volumn 88, Issue 9, 2006, Pages

  Bates Jr , Clayton W ^a   Hendricks, Alphonso J ^b   Bankman, Isaac N ^c   Thomas, Michael E ^c   Prendergast, Daniel T ^c  

^a School of Engineering   (United States)

^b Division of Armscor Business (PTY) Ltd   (South Africa)

^c JOHNS HOPKINS UNIVERSITY APPLIED PHYSICS LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

METALLIC GRAINS; PT/SI/P-SI COMPOSITES; TEMPERATURE DEPENDENCE; WAVELENGTH RANGE;

DIODES; LEAKAGE CURRENTS; PLATINUM; QUANTUM EFFICIENCY; SEMICONDUCTOR DEVICES; SILICON; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS;

COMPOSITE MATERIALS;

EID: 33644691240     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2181650     Document Type: Article

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