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Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 77, Issue 3, 2000, Pages 241-245

Transmission electron microscopy study of PtSi/Si (p-type) composites grown on Si(111) substrates

(4) Rahman, A a Bates Jr , C W a Lowe, W P a Marshall, A F b

a HOWARD UNIVERSITY (United States)

b STANFORD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; AMORPHOUS FILMS; ANNEALING; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY MEASUREMENT; FILM GROWTH; FILM PREPARATION; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SPUTTER DEPOSITION; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

COMPOSITE FILMS;

SEMICONDUCTING FILMS;

EID: 0034271270 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(00)00494-3 Document Type: Article

Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.