SCOPUS 정보 검색 플랫폼

Volumn 38, Issue 4-6, 2005, Pages 472-478

Evolution of high-dose implanted hydrogen in ZnO

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC PROPERTIES; HYDROGEN; SECONDARY ION MASS SPECTROMETRY; SINGLE CRYSTALS; ZINC OXIDE;

ROOM TEMPERATURE (RT); SCANNING SPREADING RESISTANCE MICROSCOPY (SSRM);

ION IMPLANTATION;

EID: 33644547648 PISSN: 07496036 EISSN: None Source Type: Journal
DOI: 10.1016/j.spmi.2005.08.018 Document Type: Article

Times cited : (7)

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