Attenuated total reflection infrared spectroscopy for studying adsorbates on planar model catalysts: CO adsorption on silica supported Rh nanoparticles

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 24, Issue 2, 2006, Pages 296-304

  Leewis, C M ^a   Kessels, W M M ^a   Van De Sanden, M C M ^a   Niemantsverdriet, J W ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORBENTS; ADSORPTION; CATALYSTS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; NANOSTRUCTURED MATERIALS; RHODIUM; SILICA; X RAY PHOTOELECTRON SPECTROSCOPY;

HYDROXYLATED SILICA; METAL SURFACES;

CARBON MONOXIDE;

EID: 33644522763     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2171707     Document Type: Article

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