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Volumn 36, Issue 12, 2005, Pages 3427-3438

Determination of a mean orientation in electron backscatter diffraction measurements

Author keywords

[No Author keywords available]

Indexed keywords

BRASS; CRYSTAL SYMMETRY; ELECTRON DIFFRACTION; GRAIN SIZE AND SHAPE; POLYCRYSTALLINE MATERIALS; STEEL;

EID: 33644511392     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-005-0016-4     Document Type: Article
Times cited : (101)

References (24)
  • 24
    • 33644557248 scopus 로고    scopus 로고
    • Ph.D. Thesis, Seoul National University, Seoul
    • D.I. Kim: Ph.D. Thesis, Seoul National University, Seoul, 2002.
    • (2002)
    • Kim, D.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.