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Volumn 32, Issue 8, 2001, Pages 1967-1975

A methodology for determining average lattice orientation and its application to the characterization of grain substructure

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; CRYSTAL SYMMETRY; ELECTRON DIFFRACTION; FINITE ELEMENT METHOD; GRAIN SIZE AND SHAPE; LEAST SQUARES APPROXIMATIONS; POLYCRYSTALS; TENSORS;

EID: 0035419010     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-001-0009-x     Document Type: Article
Times cited : (46)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.