|
Volumn 32, Issue 8, 2001, Pages 1967-1975
|
A methodology for determining average lattice orientation and its application to the characterization of grain substructure
a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
COMPUTER SIMULATION;
CRYSTAL LATTICES;
CRYSTAL MICROSTRUCTURE;
CRYSTAL SYMMETRY;
ELECTRON DIFFRACTION;
FINITE ELEMENT METHOD;
GRAIN SIZE AND SHAPE;
LEAST SQUARES APPROXIMATIONS;
POLYCRYSTALS;
TENSORS;
ELECTRON BACKSCATTERED DIFFRACTION (EBSD);
CRYSTAL ORIENTATION;
|
EID: 0035419010
PISSN: 10735623
EISSN: None
Source Type: Journal
DOI: 10.1007/s11661-001-0009-x Document Type: Article |
Times cited : (46)
|
References (17)
|