Studying of trap levels by the use of focused ion beams

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 231, Issue 1-4, 2005, Pages 486-490

  Medunic Z ^a   Pastuovic Z ^a   Jaksic M ^a   Skukan, N ^a  

^a RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

CdZnTe; IBIC; Temperature; Trapping; TRIBIC

Indexed keywords

CADMIUM COMPOUNDS; COMPUTER SIMULATION; ELECTRIC CURRENTS; HEATING; PROTON BEAMS; SEMICONDUCTOR MATERIALS; TEMPERATURE;

CDZNTE; IBIC; TRAPPING; TRIBIC;

ION BEAMS;

EID: 33644510127     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.01.020     Document Type: Conference Paper

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