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Volumn 219-220, Issue 1-4, 2004, Pages 1043-1050

Theory of ion beam induced charge measurement in semiconductor devices based on the Gunn's theorem

Author keywords

Charge collection efficiency; Gunn's theorem; IBIC; Nuclear microprobe; Radiation detectors; Shockley Ramo theorem

Indexed keywords

CHARGE CARRIERS; ELECTRIC CHARGE; ELECTRIC POTENTIAL; ELECTRIC SPACE CHARGE; ELECTRODES; ELECTROSTATICS; SEMICONDUCTOR DEVICES; THEOREM PROVING;

EID: 2442457516     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.01.210     Document Type: Conference Paper
Times cited : (44)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.