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Volumn 219-220, Issue 1-4, 2004, Pages 1043-1050
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Theory of ion beam induced charge measurement in semiconductor devices based on the Gunn's theorem
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Author keywords
Charge collection efficiency; Gunn's theorem; IBIC; Nuclear microprobe; Radiation detectors; Shockley Ramo theorem
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Indexed keywords
CHARGE CARRIERS;
ELECTRIC CHARGE;
ELECTRIC POTENTIAL;
ELECTRIC SPACE CHARGE;
ELECTRODES;
ELECTROSTATICS;
SEMICONDUCTOR DEVICES;
THEOREM PROVING;
CHARGE COLLECTION EFFICIENCY;
HIGH FREQUENCY VACUUM TUBES;
MULTIELECTRODE SYSTEMS;
NUCLEAR MICROPROBES;
ION BEAMS;
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EID: 2442457516
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2004.01.210 Document Type: Conference Paper |
Times cited : (44)
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References (15)
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